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Time dependent fracture behaviour in fast mechanical testing of silicon wafers
- Authors
H. Behnken and D. Franke
- 2006
- Conference Paper
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2006 IEEE 4th World Conference on Photovoltaic Energy Conversion : Waikoloa, Hawaii, 7 - 12 May 2006 ; [incorporating 32th IEEE Photovoltaic (PV) Specialist Conference and 16th Asia/Pacific (International) Photovoltaic (PV) Science and Engineering Conference] / IEEE, [the Institute of Electrical and Electronics Engineers; [IEEE Electron Device Society]. - Vol. 1
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Piscataway, NJ
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